HN2D01F 2001-06-05 1 toshiba diode silicon epitaxial planar type HN2D01F ultra high speed switching application HN2D01F is composed of 3 independent diodes. low forward voltage : v f (3) = 0.98v (typ.) fast reverse recovery time : t rr = 1.6ns (typ.) small total capacitance : c t = 0.5f (typ.) maximum ratings (ta = 25c) characteristic symbol rating unit maximum (peak) reverse voltage v rm 85 v reverse voltage v r 80 v maximum (peak) forward current i fm 240 ( * ) ma average forward current i o 80 ( * ) ma surge current (10ms) i fsm 1 ( * ) a power dissipation p 300 mw junction temperature t j 125 c storage temperature range t stg ? 55~125 c (*) this is maximum rating of single diode (q1 or q2 or q3). in the case of using 2 ro 3 diodes, the maximum ratings per diodes is 75 %f the single diode one. electrical characteristics (q1, q2, q3 common ta = 25c) characteristic symbol test circuit test condition min typ. max unit v f (1) D i f = 1ma D 0.62 D v f (2) D i f = 10ma D 0.75 D forward voltage v f (3) D i f = 100ma D 0.98 1.20 v i r (1) D v r = 30v D D 0.1 reverse current i r (2) D v r = 80v D D 0.5 a total capacitance c t D v r = 0, f = 1mh z D 0.5 3.0 pf reverse recovery time t rr D i f = 10ma (fig.1) D 1.6 4.0 ns jedec D eiaj sc-74 toshiba 1-3k1c weight: 0.015g unit in mm
HN2D01F 2001-06-05 2 pin assignment (top view) marking
HN2D01F 2001-06-05 3 fig.1 reverse recovery time (t rr ) test circuit
HN2D01F 2001-06-05 4 toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation or others. the information contained herein is subject to change without notice. 000707ea a restrictions on product use
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